INFLUENCE OF ELECTRON-RADIATION TO PAPER QUALITIES

被引：0
|
作者：
GRAUER, G
HLOCH, P
HOFER, HH
KOPF, C
机构：
来源：
WOCHENBLATT FUR PAPIERFABRIKATION | 1983年 / 111卷 / 22期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学]; TS [轻工业、手工业、生活服务业];
学科分类号：
0805 ; 080502 ; 0822 ;
摘要：
引用
收藏
页码：810 / 812
页数：3
相关论文
共 50 条
  • [1] ELECTRON-RADIATION IN TUNGSTEN CRYSTALS
    BAIER, VN
    BASKOV, VA
    GANENKO, VB
    GOVORKOV, BB
    ZHEBROVSKII, YV
    KATKOV, VM
    KIM, VV
    KOLESNIKOV, LY
    LUCHKOV, BI
    MAISHEEV, VA
    RUBASHKIN, AL
    SERGIENKO, VI
    SOROKIN, PV
    STRAKHOVENKO, VM
    TUGAENKO, VY
    KHABLO, VA
    ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1992, 101 (04): : 1351 - 1354
  • [2] LACQUER HARDENING BY ELECTRON-RADIATION
    DRAWE, H
    CHEMIKER-ZEITUNG, 1980, 104 (06): : 189 - 193
  • [3] INDUCED AUTORESONANCE ELECTRON-RADIATION
    ANDREEV, YA
    DAVYDOVSKII, VY
    SAPOGIN, VG
    ZHURNAL TEKHNICHESKOI FIZIKI, 1977, 47 (03): : 495 - 503
  • [4] DIFFERENTIAL CALORIMETER FOR ELECTRON-RADIATION
    STRAKOVSKAYA, RY
    STAS, AG
    KOVALENKO, LM
    LUKASHEVICH, LA
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1977, 20 (05) : 1467 - 1470
  • [5] ELECTRON-RADIATION ENERGIES IN MYONIC ATOMS
    BOSCHUNG, M
    BERGEM, P
    BIENZ, F
    PHAN, TQ
    PILLER, G
    SCHALLER, LA
    SCHELLENBERG, L
    SCHNEUWLY, H
    HELVETICA PHYSICA ACTA, 1984, 57 (04): : 554 - 554
  • [6] ELECTRON-RADIATION EFFECTS ON SI PHOTODIODES
    REFT, CS
    BECHER, J
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (01): : 42 - 42
  • [7] ELECTRON-RADIATION DAMAGE AND REMEDIAL TECHNIQUES
    VALDRE, U
    ULTRAMICROSCOPY, 1985, 17 (04) : 405 - 406
  • [8] HADRON ANALOGS OF A CLASSICAL ELECTRON-RADIATION
    DREMIN, IM
    JETP LETTERS, 1981, 34 (11) : 594 - 597
  • [9] GAMMA AND ELECTRON-RADIATION EFFECTS IN CDTE
    TAGUCHI, T
    SHIRAFUJI, J
    INUISHI, Y
    NUCLEAR INSTRUMENTS & METHODS, 1978, 150 (01): : 43 - 48
  • [10] ELECTRON-RADIATION DAMAGE OF POLYPYROMELLITIMIDE FILMS
    FERL, JE
    LONG, ER
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03): : 285 - 285
12345