RELATION OF EDDY-CURRENT LOSSES WITH DOMAIN-WALL MOVEMENT OF VERY THIN 3-PERCENT-SI-FE STRIP WOUND CORES

被引:2
|
作者
KIM, YH
YAMAGUCHI, M
ARAI, KI
机构
[1] Research Institute of Electrical Communication, Tohoku University, Aoba-Ku, Sendai, 980
关键词
D O I
10.1109/20.179625
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses the relation of the eddy current losses with dynamic domain behavior for very thin 3% Si-Fe strip-wound cores up to 5kHz. The dynamic domain behavior was observed by using an SEM. The stripe domain structure, B-8 and H(c) were recovered after the strip is wound into a core and annealed above 800-degrees-C. The wall bowing was negligible up to 1kHz if the strip thickness was below 59-mu-m. On the basis of these experiments, the measured domain wall numbers were compared with the calculated ones from Vm/He. Also, the eddy current losses were calculated by applying the observed domain wall numbers to the modified Pry and Bean model and compared with the measured ones. The measured eddy current losses agreed comparatively well with the calculated ones above 500Hz. The same tendency was obtained in the comparison of the observed domain wall numbers with the calculated ones.
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页码:2781 / 2783
页数:3
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