DIFFRACTION OF DISCRETE X-RAY FREQUENCIES FROM GERMANIUM ATOMS IN CRYSTALS

被引：0

作者：

GUPTA, KD ^{[1
]}

机构：

[1] TEXAS TECH UNIV,DEPT PHYS & ENGN PHYS,LUBBOCK,TX 79409

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 06期

关键词：

D O I：

10.1063/1.322941

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2765 / 2766

页数：2

共 50 条

[1] X-RAY DIFFRACTION PROPERTIES OF SILICON + GERMANIUM SINGLE CRYSTALS
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