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- [7] COMMENTS ON MEASUREMENTS OF MINORITY-CARRIER DIFFUSION LENGTH IN N-CUINSE2 BY ELECTRON-BEAM-INDUCED CURRENT METHOD - REPLYJOURNAL OF APPLIED PHYSICS, 1990, 68 (07) : 3760 - 3760SCHEER, RLEWERENZ, HJ
- [8] Evaluation of minority-carrier diffusion length in n-type β-FeSi2 single crystals by electron-beam-induced currentAPPLIED PHYSICS LETTERS, 2008, 92 (04)Ootsuka, TeruhisaSuemasu, TakashiChen, JunSekiguchi, Takashi
- [9] LASER-BEAM INDUCED CURRENT MEASUREMENTS OF MINORITY-CARRIER DIFFUSION LENGTHCANADIAN JOURNAL OF PHYSICS, 1987, 65 (08) : 814 - 820OLIVER, BADIXON, AE