ASPECTS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY OF MINERALS

被引：0

作者：

BUSECK, PR

IIJIMA, S

机构：

[1] ARIZONA STATE UNIV,DEPT GEOL,TEMPE,AZ 85281

[2] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85281

[3] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

关键词：

D O I：

暂无

中图分类号：

P3 [地球物理学]; P59 [地球化学];

学科分类号：

0708 ; 070902 ;

摘要：

引用

页码：1131 / 1132

页数：2

共 50 条

[1] STUDY OF MINERALS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
MORIMOTO, N
[J]. JOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (01): : 56 - 56
[2] DEFECTS IN MINERALS AS OBSERVED WITH HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
BUSECK, PR
VEBLEN, DR
[J]. BULLETIN DE MINERALOGIE, 1981, 104 (2-3): : 249 - 260
[3] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SOME MINERALS OF LAYER SILICATE
IIJIMA, S
[J]. JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 69 - 69
[4] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
OKEEFE, MA
[J]. ULTRAMICROSCOPY, 1992, 47 (1-3) : 282 - 297
[5] HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
[J]. ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1987, 38 : 57 - 88
[6] HIGH-RESOLUTION ELECTRON-MICROSCOPY
HASHIMOTO, H
[J]. ULTRAMICROSCOPY, 1984, 12 (1-2) : 90 - 90
[7] HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
[J]. HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 463 - 477
[8] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY APPLIED TO CLAY-MINERALS
GUTHRIE, GD
VEBLEN, DR
[J]. ACS SYMPOSIUM SERIES, 1989, 415 : 75 - 93
[9] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY APPLIED TO CLAY-MINERALS
GUTHRIE, GD
VEBLEN, DR
[J]. SPECTROSCOPIC CHARACTERIZATION OF MINERALS AND THEIR SURFACES, 1989, 415 : 75 - 93
[10] APPLICATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPY FOR CLAY-MINERALS INVESTIGATION
EBERHART, JP
[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (05): : 495 - &