SPECTRAL-LINE SHAPE-ANALYSIS AND SYSTEMATIC FREQUENCY-SHIFTS OF LASER FREQUENCY STANDARDS

被引:2
|
作者
PENDRILL, LR
KARN, U
机构
[1] Swedish National Testing & Research Institute, S-501 15, Borås, Weights & Measures
关键词
D O I
10.1109/19.278594
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A practical realization of the unit of length often relies on values of the frequency of optical frequency standards in the form of frequency stabilized lasers. A technique of frequency stabilization commonly employed for He-Ne lasers at 633 nm stabilized in frequency to hyperfine spectral components in the saturated absorption spectrum of molecular iodine is that based on phase-sensitive detection at the third harmonic of a modulation frequency. In this paper, a systematic study is made of how frequency shifts are related to observations of offset voltages in the feedback loop which vary across the iodine spectrum. A simple model based on spectral line shape analysis is found to apply to a variety of lasers possessing moderate offsets.
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页码:415 / 419
页数:5
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