REDUCTION OF PENETRATION EFFECT AT SHARP EDGES IN THE SCANNING ELECTRON-MICROSCOPE (SEM)

被引：2
|
作者：
WELLS, OC
BAILEY, PJ
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 138卷 / APR期
关键词：
D O I：
10.1111/j.1365-2818.1985.tb02590.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：RP3 / RP4
页数：2
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