LINEAR IMAGING IN SCANNING POLARIZATION INTERFERENCE CONTRAST MICROSCOPY

被引：7
|
作者：
SEE, CW
IRAVANI, MV
机构：
来源：
ELECTRONICS LETTERS | 1986年 / 22卷 / 20期
关键词：
D O I：
10.1049/el:19860740
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1079 / 1081
页数：3
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