GE-SI ALLOY MICROSTRUCTURE FABRICATION BY DIRECT-LASER WRITING WITH ANALYSIS BY RAMAN MICROPROBE SPECTROSCOPY

被引：21
|
作者：
HERMAN, IP [1 ]
MAGNOTTA, F [1 ]
机构：
[1] UNIV CALIF LAWRENCE LIVERMORE NATL LAB,DEPT PHYS,LIVERMORE,CA 94550
来源：
JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 11期
关键词：
D O I：
10.1063/1.338286
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5118 / 5128
页数：11
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    [J]. APPLIED PHYSICS LETTERS, 1986, 48 (02) : 195 - 197
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    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (03): : 248 - 248
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    Volodin, V. A.
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    Efremov, M. D.
    Nikiforov, A. I.
    Yakimov, A. I.
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