共 50 条
- [1] Ellipsometric investigation of anodic hafnium oxide films[J]. ELECTROCHIMICA ACTA, 1997, 42 (09) : 1315 - 1324Esplandiu, MJPatrito, EMMacagno, VA
- [2] OPTICAL PROPERTIES OF ANODIC OXIDE FILMS ON TANTALUM, NIOBIUM, AND TANTALUM + NIOBIUM ALLOYS, AND THE OPTICAL CONSTANTS OF TANTALUM[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (05) : 428 - 438MASING, LORME, JEYOUNG, L
- [3] ELLIPSOMETRIC STUDY OF IONIC CONDUCTION IN ANODIC OXIDE FILMS ON TANTALUM AND NIOBIUM[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (03) : C57 - &YOUNG, LZOBEL, FGR
- [4] ELLIPSOMETRIC INVESTIGATION OF ANODIC ZIRCONIUM-OXIDE FILMS[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (06) : 1576 - 1585PATRITO, EMMACAGNO, VA
- [5] ELLIPSOMETRIC STUDIES OF ANODIC OXIDE FILMS FORMED ON TANTALUM IN DILUTE PHOSPHORIC ACID[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (12) : 1545 - &DELLOCA, CJYOUNG, L
- [6] An investigation of structures of thermal and anodic tantalum oxide films[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (02) : B60 - B64Maeng, SAxe, LTyson, TJiang, A
- [7] INFLUENCE OF THE FORMING ELECTROLYTE ON THE OPTICAL-PROPERTIES OF ANODIC ZIRCONIUM-OXIDE FILMS .1. ELLIPSOMETRIC INVESTIGATION[J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1994, 371 (1-2): : 59 - 71PATRITO, EMMACAGNO, VA
- [8] COMPARISON OF SPECTROPHOTOMETRIC AND ELLIPSOMETRIC METHODS OF MEASURING THE THICKNESS OF ANODIC OXIDE-FILMS ON TANTALUM[J]. THIN SOLID FILMS, 1983, 101 (01) : 11 - 19SMITH, DJYOUNG, L
- [9] CONDUCTION AND DIELECTRIC PROPERTIES OF ANODIC OXIDE FILMS ON TANTALUM[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (08) : C213 - &DIGNAM, MJTAYLOR, DF
- [10] MECHANICAL PROPERTIES OF ANODIC TANTALUM OXIDE-FILMS[J]. THIN SOLID FILMS, 1972, 12 (02) : 319 - +ELIEZER, DBRANDON, DG