MICROHARDNESS OF BI12SIO20, BI12TIO20, AND BI12GEO20 MONOCRYSTALS

被引：1
|
作者：
PAMUKCHIEVA, VD
TRIFONOVA, EP
HITOVA, L
HADJIISKI, A
机构：
[1] UNIV SOFIA,DEPT PHYS,BU-1126 SOFIA,BULGARIA
[2] UNIV SOFIA,INST SEMICOND PHYS & TECHNOL,BU-1126 SOFIA,BULGARIA
来源：
CRYSTAL RESEARCH AND TECHNOLOGY | 1993年 / 28卷 / 01期
关键词：
D O I：
10.1002/crat.2170280120
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The microhardness, H, of Sillenite-type monocrystals of undoped Bi12SiO20, Bi12TiO20, Bi12GeO20 and Cr-, Fc-, Mn- doped Bi12SiO20 has been investigated. The dependences of H on the surface treatment, dopants and orientation of the materials have been established. It was found that the H and dislocation density, N(d), distribution along the diameter of the sample for undoped (100)-Bi12SiO20 are of M- and W-shape, respectively.
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页码：119 / 123
页数：5
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