MEASUREMENT OF EARTH STRAINS WITH A LASER INTERFEROMETER

被引：2
|
作者：
SAKURAI, Y [1 ]
SEINO, S [1 ]
OHISHI, T [1 ]
机构：
[1] NATL RES LAB METROL,TOKYO,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1976年 / 15卷 / 09期
关键词：
D O I：
10.1143/JJAP.15.1859
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1859 / 1860
页数：2
相关论文
共 50 条
  • [1] A LASER INTERFEROMETER FOR MEASUREMENT OF THE EARTH CRUST STRAINS
    ALESHIN, VA
    DUBROV, MN
    IAKOVLEV, AP
    DOKLADY AKADEMII NAUK SSSR, 1980, 253 (06): : 1343 - 1346
  • [2] Wide-band laser interferometer for monitoring the Earth strains
    Milyukov, VK
    Rudenko, BN
    Klyachko, BS
    Kart, AM
    Myasnikov, AV
    IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1999, 63 (06): : 1192 - 1197
  • [3] Wide-band laser interferometer for monitoring the Earth strains
    Milyukov, VK
    Rudenko, VN
    Klyachko, BS
    Kart, AM
    Myasnikov, AV
    SOLID STATE LASERS - LASER OPTICS '98, 1998, 3682 : 117 - 125
  • [4] MEASUREMENT OF EARTH TIDES + CONTINENTAL DRIFT WITH LASER INTERFEROMETER
    VALI, V
    VALI, W
    KROGSTAD, RS
    PROCEEDINGS OF THE IEEE, 1964, 52 (07) : 857 - &
  • [5] Laser interferometer antenna array records seismo-acoustic earth strains
    Dubrov, M. N.
    Aleksandrov, D. V.
    2007 6TH INTERNATIONAL CONFERENCE ON ANTENNA THEORY AND TECHNIQUES, PROCEEDINGS, 2007, : 307 - 308
  • [6] LASER INTERFEROMETER FOR EARTH STRAIN MEASUREMENTS
    VALI, V
    KROGSTAD, RS
    MOSS, RW
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (09): : 1352 - &
  • [7] EARTH STRAIN MEASUREMENTS WITH A LASER INTERFEROMETER
    BERGER, J
    LOVBERG, RH
    SCIENCE, 1970, 170 (3955) : 296 - &
  • [8] Design of a Michelson interferometer for the measurement of electrostrictive strains
    Kloos, G
    OPTICS AND LASER TECHNOLOGY, 1996, 28 (06): : 481 - 484
  • [9] MEASURING EARTH STRAINS BY LASER
    VALI, V
    SCIENTIFIC AMERICAN, 1969, 221 (06) : 89 - &
  • [10] LASER INTERFEROMETER FOR THE STUDY OF PIEZOELECTRIC AND ELECTROSTRICTIVE STRAINS
    ZHANG, QM
    PAN, WY
    CROSS, LE
    JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) : 2492 - 2496
12345