TIP STRUCTURE DETERMINATION BY SCANNING TUNNELING MICROSCOPY

被引：0

作者：

VANDEWALLE, GFA ^{[1
]}

VANKEMPEN, H ^{[1
]}

WYDER, P ^{[1
]}

机构：

[1] MAX PLANCK INST FESTKORPERFORSCH,HOCHFELD MAGNETLAB,F-38042 GRENOBLE,FRANCE

来源：

SURFACE SCIENCE | 1986年 / 167卷 / 2-3期

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：L219 / L224

页数：6

共 50 条

[1] ROLE OF TIP STRUCTURE IN SCANNING TUNNELING MICROSCOPY
KUK, Y
SILVERMAN, PJ
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (23) : 1597 - 1599
[2] DIRECT TIP STRUCTURES DETERMINATION BY SCANNING TUNNELING MICROSCOPY
CANTU, RG
GARNICA, MAH
[J]. JOURNAL DE PHYSIQUE, 1989, 50 (C8): : C8235 - C8240
[3] A scanning tunneling microscopy tip with a stable atomic structure
Yeong-Cheol Kim
David N. Seidman
[J]. Metals and Materials International, 2004, 10 : 97 - 101
[4] TIP ELECTRONIC-STRUCTURE IN SCANNING TUNNELING MICROSCOPY
TROMP, RM
VANLOENEN, EJ
DEMUTH, JE
LANG, ND
[J]. PHYSICAL REVIEW B, 1988, 37 (15): : 9042 - 9045
[5] A scanning tunneling microscopy tip with a stable atomic structure
Kim, YC
Seidman, DN
[J]. METALS AND MATERIALS INTERNATIONAL, 2004, 10 (01) : 97 - 101
[6] INSITU CHARACTERIZATION OF TIP ELECTRONIC-STRUCTURE IN SCANNING TUNNELING MICROSCOPY
CHEN, CJ
[J]. ULTRAMICROSCOPY, 1992, 42 : 147 - 153
[7] FABRICATION OF THE TIP FOR ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPY
Zhen Fang CHEN Er Kang WANG~* Laboratory of Electroanalytical Chemistry
[J]. Chinese Chemical Letters, 1992, (10) : 845 - 848
[8] EVIDENCE FOR TIP IMAGING IN SCANNING TUNNELING MICROSCOPY
VANLOENEN, EJ
DIJKKAMP, D
HOEVEN, AJ
LENSSINCK, JM
DIELEMAN, J
[J]. APPLIED PHYSICS LETTERS, 1990, 56 (18) : 1755 - 1757
[9] Carbon nanotube tip for scanning tunneling microscopy
Shingaya, Y
Nakayama, T
Aono, M
[J]. PHYSICA B-CONDENSED MATTER, 2002, 323 (1-4) : 153 - 155
[10] Tunneling into Bloch states from a tip in scanning tunneling microscopy
Kobayashi, K
[J]. PHYSICAL REVIEW B, 1999, 59 (20): : 13251 - 13257

← 1 2 3 4 5 →