4-K RAM USERS CHECK ON RELIABILITY

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ARMSTRONG, L

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ELECTRONICS | 1976年 / 49卷 / 05期

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页码：72 / &

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[2] UNCOMPROMISING 4-K STATIC RAM RUNS FAST ON LITTLE POWER
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[J]. ELECTRONICS, 1977, 50 (10): : 99 - 103
[3] STRUCTURE OF TETRAIODOETHYLENE AT 4-K
HAYWOOD, BC
SHIRLEY, R
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1977, 33 (JUN15): : 1765 - 1773
[4] FEH MOLECULE AT 4-K
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VANZEE, RJ
WELTNER, W
[J]. ASTROPHYSICAL JOURNAL, 1979, 231 (02): : 632 - 636
[5] SPEED 4-K OR 16-K RAM EVALUATION WITH A LOW-COST RASTER-SCAN TESTER
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[J]. ELECTRONIC DESIGN, 1978, 26 (19) : 118 - 122
[6] RELIABILITY PROGRAM AND RESULTS FOR A 4K DYNAMIC RAM
BATDORF, HA
HENSLER, DH
WASSON, RD
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) : 52 - 56
[7] NOISE THERMOMETRY BELOW 4-K
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STEUTEN, HM
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 : 1739 - 1740
[8] PELTIER MEASUREMENTS BELOW 4-K
TRODAHL, HJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (05): : 648 - &
[9] MOSSBAUER PARAMETERS FOR FERRIHYDRITES AT 4-K
CHILDS, CW
DICKSON, DPE
GOODMAN, BA
LEWIS, DG
[J]. AUSTRALIAN JOURNAL OF SOIL RESEARCH, 1984, 22 (02): : 149 - 154
[10] SERRATED BEHAVIOR OF METALS AND ALLOYS AT 4-K
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[J]. TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1987, 73 (05): : S547 - S547