PROPERTIES OF YBACUO THIN-FILM SINGLE-LEVEL DC-SQUIDS FABRICATED USING STEP-EDGE JUNCTIONS

被引：6
|
作者：
SUN, JZ [1 ]
YUJAHNES, LS [1 ]
FOGLIETTI, V [1 ]
KOCH, RH [1 ]
GALLAGHER, WJ [1 ]
机构：
[1] CNR, IST ELETTR DELLO STATO SOLIDO, ROME, ITALY
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期
关键词：
D O I：
10.1109/77.402999
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A quantitative comparison study of single-level step-edge junction-based SQUIDs and bicrystal-substrate-based SQUIDs is given, Similar SQUID performance was found in terms of white flux noise level and junction-critical-current-related 1/f noise. Excess current was found in most step-edge devices, Issues related to systems applications, such as magnetic field-induced noise, junction cyclability upon repeated use, and environmental stability of oxide-metal contacts are also discussed.
引用
收藏
页码：2107 / 2111
页数：5
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