X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES ON SILICON-CARBIDE FROM RICE HUSK

被引：1

|

作者：

PATEL, M

机构：

来源：

X-RAY SPECTROMETRY | 1989年 / 18卷 / 05期

关键词：

D O I：

10.1002/xrs.1300180507

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：215 / 218

页数：4

相关论文

共 50 条

[1] CORRELATED SCANNING AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATIONS OF SILICON-CARBIDE POWDERS
CONTARINI, S
LAMBERS, E
HOLLOWAY, PH
[J]. APPLIED SURFACE SCIENCE, 1992, 62 (03) : 181 - 188
[2] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF THE EFFECT OF ION ETCHING OF SILICON-CARBIDE ON A CARBON-FIBER
ROOKE, MA
SHERWOOD, PMA
[J]. CARBON, 1995, 33 (04) : 375 - 380
[3] INCREASE IN THE YIELD OF SILICON-CARBIDE WHISKERS FROM RICE HUSK
BHAT, BVR
SANGHI, GP
[J]. BULLETIN OF MATERIALS SCIENCE, 1987, 9 (04) : 295 - 303
[4] X-RAY STUDY OF SILICON-CARBIDE FIBERS
GRINEVICH, GP
ZAKHARENKO, NI
KOPAN, VS
SILENKO, PM
[J]. SOVIET POWDER METALLURGY AND METAL CERAMICS, 1990, 29 (09): : 728 - 731
[5] X-ray photoelectron spectroscopic studies of black silicon for solar cell
Xia, Yang
Liu, Bangwu
Zhong, Sihua
Li, Chaobo
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2012, 184 (11-12) : 589 - 592
[6] OXIDATION-KINETICS OF SILICON-CARBIDE WHISKERS STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY
WANG, PS
HSU, SM
WITTBERG, TN
[J]. JOURNAL OF MATERIALS SCIENCE, 1991, 26 (06) : 1655 - 1658
[7] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF SBSI
IKEMOTO, I
[J]. BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1981, 54 (08) : 2519 - 2520
[8] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF PRUSSIATES
BINDER, H
[J]. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1977, 429 (02): : 247 - 254
[9] EFFECT OF CATALYSTS AND TEMPERATURE ON SILICON-CARBIDE WHISKERS FORMATION FROM RICE HUSK
RAY, AK
MAHANTY, G
GHOSE, A
[J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1991, 10 (04) : 227 - 229
[10] X-RAY DIFFRACTOMETRIC ANALYSIS OF POLYTYPIC STRUCTURES OF SILICON-CARBIDE
LEVCHUK, BI
TSVETKOV, VF
CHERNOV, MA
[J]. KRISTALLOGRAFIYA, 1982, 27 (03): : 610 - 612

← 1 2 3 4 5 →