ELECTRICAL CHARACTERIZATION OF GRIDDED FIELD-EMISSION ARRAYS

被引：0
|
作者：
HOWELL, DF
GROVES, RD
LEE, RA
PATEL, C
WILLIAMS, HA
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1989年 / 99期
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We report the results of experiments on gridded arrays of wet-etched silicon field emission tips. Both I-V measurements and angle resolved electron emission spectra are presented. We found that emission occurred from a small fraction of the available surface area with an anomalously small radius of curvature. The spectroscopic measurements revealed that the emission originated from several eV below the Fermi energy in the silicon and that the linewidth was narrow with DELTA-E = 0.28eV (FWHM).
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页码：81 / 84
页数：4
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