X-RAY DIFFRACTOMETERS WITH A MULTIWIRE PROPORTIONAL CHAMBER FOR MULTIWAVELENGTH ANOMALOUS DATA-COLLECTION

被引：0
|
作者：
KAHN, R
FOURME, R
BOSSHARD, R
机构：
[1] UNIV PARIS 11,F-91405 ORSAY,FRANCE
[2] UNIV PARIS 12,F-94000 CRETEIL,FRANCE
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷
关键词：
D O I：
10.1107/S0108767384088139
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：C404 / C404
页数：1
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