X-ray Diffraction Analysis of Residual Stress in Laminated Ceramic

被引：4

作者：

Jin, Young Ho ^{[1
]}

Chung, Dong Yoon ^{[1
]}

机构：

[1] Korea Mil Acad, Dept Weap & Mech Engn, Seoul 139799, South Korea

来源：

JOURNAL OF THE KOREAN CERAMIC SOCIETY | 2011年 / 48卷 / 05期

关键词：

Residual stress; Ceramic laminate; X-ray diffraction; Finite element analysis;

D O I：

10.4191/kcers.2011.48.5.458

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The strength of ceramic was improved by lamination by suppressing the propagation of cracks with compressive residual stress in the face layer of the laminate. Hot pressed SiAlON+SiC/SiC/SiAlON+SiC laminate discs were fabricated for tailored residual stress. The residual stress in this laminate was studied by X-ray diffraction (XRD). There was considerable compressive residual stress in the face layer. A Finite Element Analysis (FEA) was performed to support the measured XRD results and to determine the stress field in the laminate. The residual stress measured by XRD had satisfactory agreement with the analytically calculated and FEA values. The measured value by XRD was -385 +/- 20 MPa over most of the face layer. The calculated and FEA values were -386 MPa and -371 MPa, respectively. FEA also showed significantly modified stresses and the maximum tensile stress near the edge region which are possible crack generators in the presence of flaws or contact damage.

引用

页码：458 / 462

页数：5

共 50 条

[1] Residual stress and microstructure analysis with X-ray diffraction
He, Bob Baoping
PROCEEDINGS OF THE SIXTEENTH (2006) INTERNATIONAL OFFSHORE AND POLAR ENGINEERING CONFERENCE, VOL 4, 2006, : 37 - 42
[2] RESIDUAL-STRESS ANALYSIS USING X-RAY DIFFRACTION
BAUCUM, WE
EXPERIMENTAL MECHANICS, 1971, 11 (05) : N36 - &
[3] Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques
Atar, E
Sarioglu, C
Demirler, U
Kayali, ES
Cimenoglu, H
SCRIPTA MATERIALIA, 2003, 48 (09) : 1331 - 1336
[4] External reference samples for residual stress analysis by X-ray diffraction
Lefebvre, F.
Francois, M.
Cacot, J.
Hemery, C.
Le-bec, P.
Baumhauer, E.
Bouscaud, D.
Bergey, T.
Blaize, D.
Gloaguen, D.
Lebrun, J. L.
Cosson, A.
Kubler, R.
Cheynet, Y.
Daniel, E.
Michaud, H.
Monvoisin, J. C.
Blanchet, P.
Allain, P.
Mrini, Y.
Sprauel, J. M.
Goudeau, P.
Barbarin, P.
Charles, C.
Le Roux, J. M.
Seiler, W.
Fischer, C.
Desmas, L.
Ouakka, A.
Moya, M. J.
Bordiec, Y.
RESIDUAL STRESSES VIII, 2011, 681 : 215 - +
[5] Residual Stress Analysis of Textured Materials by X-ray Diffraction Method
Ejiri, Shouichi
Sasaki, Toshihiko
Hirose, Yukio
THERMEC 2011, PTS 1-4, 2012, 706-709 : 1673 - +
[6] PRECIX, robotic system for residual stress analysis by X-ray diffraction
Lefebvre, F.
Le Roux, J. M.
Charles, C.
Pilliere, H.
Berthier, E.
Fontugne, C.
RESIDUAL STRESSES VIII, 2011, 681 : 202 - +
[7] External reference samples for residual stress analysis by X-ray diffraction
Lefebvre, F.
Wasniewski, E.
Francois, M.
Cacot, J.
Le-bec, P.
Baumhauer, E.
Bouscaud, D.
Bergey, T.
Blaize, D.
Gloaguen, D.
Cosson, A.
Jegou, S.
Cheynet, Y.
Leray, S.
Meheux, M.
Monvoisin, J. C.
Allain, P.
Vidal, J. C.
Sprauel, J. M.
Goudeau, P.
Charles, C.
Daflon, L.
Fischer, C.
Desmas, L.
Ouakka, A.
Moya, M. J.
Bordiec, Y.
Hamdi, H.
RESIDUAL STRESSES IX, 2014, 996 : 221 - +
[8] High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds
Vila, M
Prieto, C
Miranzo, P
Osendi, MI
Terry, AE
Vaughan, GBM
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 238 (1-4): : 119 - 123
[9] RESIDUAL STRESS MEASUREMENT OF CFRP BY X-RAY DIFFRACTION
Doi, Taisei
Nishida, Masayuki
Ozaki, Junichi
20TH INTERNATIONAL CONFERENCE ON COMPOSITE MATERIALS, 2015,
[10] Measuring casting residual stress with X-ray diffraction
Modern Casting, 2005, 95 (09) : 48 - 49

← 1 2 3 4 5 →