RELIABILITY EXPLORATION OF MICROCOMPUTER SYSTEMS USING THE WEIBULL DISTRIBUTION

被引：0
|
作者：
JOZWIAK, IJ
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 03期
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暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The Weibull model is utilized for reliability exploration of microcomputer systems. The usefulness of the model for reliability exploration of technical systems is shown.
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页码：337 / 340
页数：4
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