TIME-RESOLVED REFLECTIVITY MEASUREMENTS IN SILICON

被引：7

|

作者：

COMBESCOT, M

BOK, J

机构：

来源：

PHYSICAL REVIEW LETTERS | 1983年 / 51卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.51.519

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：519 / 519

页数：1

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