AXICON-SCANNED FABRY-PEROT SPECTROMETER

被引：27
|
作者：
KATZENSTEIN, J
机构：
来源：
APPLIED OPTICS | 1965年 / 4卷 / 03期
关键词：
D O I：
10.1364/AO.4.000263
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：263 / +
页数：1
相关论文
共 50 条
  • [1] VERSATILE SPECTROMETER BY THE USE OF A PRESSURE-SCANNED FABRY-PEROT INTERFEROMETER AND A PIEZOELECTRICALLY-SCANNED FABRY-PEROT INTERFEROMETER IN TANDEM ARRANGEMENT.
    Hikita, Tomoyuki
    Suzuki, Hiroko
    Ikeda, Takuro
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1987, 26 (06): : 936 - 940
  • [2] A MULTI-CHANNEL PHOTOELECTRIC SPECTROMETER EMPLOYING A FABRY-PEROT ETALON AND AXICON
    KATHCEN, GI
    KATZENST.J
    LOVISETT.L
    [J]. JOURNAL DE PHYSIQUE, 1967, 28 (3-4S): : 230 - &
  • [3] MAGNETOSTRICTIVELY SCANNED FABRY-PEROT INTERFEROMETER
    SLATER, PN
    BETZ, HT
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (11) : 1358 - &
  • [4] Holographic Fabry-Perot spectrometer
    Martinez-Matos, O.
    Rodrigo, Jose A.
    Vaveliuk, P.
    Calvo, M. L.
    [J]. OPTICS LETTERS, 2011, 36 (04) : 564 - 566
  • [5] FABRY-PEROT LASER SPECTROMETER
    ATUTOV, SN
    KOCHANOV, VP
    SAPRYKIN, EG
    SMIRNOV, GI
    [J]. OPTIKA I SPEKTROSKOPIYA, 1977, 43 (02): : 331 - 338
  • [6] FABRY-PEROT RECYCLING SPECTROMETER
    BEHN, R
    DOBELE, HF
    [J]. APPLIED OPTICS, 1976, 15 (07): : 1850 - 1855
  • [7] Fabry-Perot interferometer scanned by geometric phase
    Ohno, Seigo
    [J]. 2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2018,
  • [8] REFRACTOMETER ASSOCIATED WITH FABRY-PEROT SPECTROMETER
    GAGNE, JM
    GIROUX, M
    SAINTDIZ.JP
    [J]. APPLIED OPTICS, 1973, 12 (03): : 522 - 527
  • [9] AURORAL AND AIRGLOW FABRY-PEROT SPECTROMETER
    HECHT, JH
    CHRISTENSEN, AB
    PRANKE, JB
    CHATER, WT
    HOWEY, CK
    LOTT, RL
    SIVJEE, MG
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02): : 240 - 247
  • [10] INSTRUMENT FUNCTION OF THE FABRY-PEROT SPECTROMETER
    WILKSCH, PA
    [J]. APPLIED OPTICS, 1985, 24 (10): : 1502 - 1511
12345