A NON-DESTRUCTIVE X-RAY-DIFFRACTION PROBE FOR THIN NEAR-SURFACE LAYERS

被引:0
|
作者
GRABOWSKI, KS
NEISER, RA
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
[2] VIRGINIA POLYTECH INST & STATE UNIV,DEPT MAT ENGN,BLACKSBURG,VA 24061
来源
JOURNAL OF METALS | 1983年 / 35卷 / 08期
关键词
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:A13 / A13
页数:1
相关论文
共 50 条
  • [1] X-RAY-DIFFRACTION ON LASER DISTURBED NEAR-SURFACE CRYSTAL LAYERS
    PUNEGOV, VI
    PETRAKOV, AP
    TIKHONOV, NA
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1990, 122 (02): : 449 - 458
  • [2] DETECTION OF DISLOCATION NETS IN THIN NEAR-SURFACE CRYSTAL DOMAINS BY THE SLIDING X-RAY-DIFFRACTION METHOD
    SHCHEGLOV, MP
    RUVIMOV, SS
    KYUTT, RN
    SOROKIN, LM
    [J]. ZHURNAL TEKHNICHESKOI FIZIKI, 1988, 58 (03): : 583 - 585
  • [3] Magneto-optical non-destructive testing of near-surface layers of thin CoNi films with the depth depended properties
    Dong, YB
    Zubov, VE
    [J]. NON-LINEAR ELECTROMAGNETIC SYSTEMS: ADVANCED TECHNIQUES AND MATHEMATICAL METHODS, 1998, 13 : 205 - 208
  • [4] A NON-DESTRUCTIVE X-RAY METHOD FOR THE DETERMINATION OF THE THICKNESS OF SURFACE LAYERS
    GAY, P
    HIRSCH, PB
    [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1951, 2 (AUG): : 218 - 222
  • [5] Application of X-ray diffraction in Laue geometry to imperfect near-surface layers
    Kyutt, RN
    Argunova, TS
    [J]. NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 267 - 275
  • [6] X-RAY-DIFFRACTION STUDY OF THIN POROUS SILICON LAYERS
    LOMOV, AA
    BELLET, D
    DOLINO, G
    [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1995, 190 (01): : 219 - 226
  • [7] APPLICATION OF X-RAY-DIFFRACTION IN THE STUDY OF THIN GAN LAYERS
    FREMUNT, R
    ROSICKA, V
    [J]. CHEMICKE LISTY, 1980, 74 (04): : 424 - 427
  • [8] X-RAY-DIFFRACTION MEASUREMENTS FROM IMPERFECT GAAS CRYSTALS - EVIDENCE FOR NEAR-SURFACE DEFECTS
    BLOCH, R
    BAHR, D
    OLDE, J
    BRUGEMANN, L
    PRESS, W
    [J]. PHYSICAL REVIEW B, 1990, 42 (08): : 5093 - 5099
  • [9] Non-destructive measurement of artificial near-surface cracks for railhead inspection
    Anandika, R.
    Stenstrom, C.
    Lundberg, J.
    [J]. INSIGHT, 2019, 61 (07) : 373 - 379
  • [10] X-RAY-DIFFRACTION METHOD FOR CHARACTERIZATION OF THIN SURFACE-LAYERS AND THIN EPITAXIAL-FILMS
    ITOH, N
    [J]. APPLIED PHYSICS LETTERS, 1993, 62 (07) : 690 - 692