2-DIMENSIONAL METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR FOR ULTRA-LOW POWER CIRCUIT APPLICATIONS

被引:15
|
作者
PEATMAN, WCB
PARK, H
SHUR, M
机构
[1] Department of Electrical Engineering, University of Virginia, Charlottesville, VA
关键词
D O I
10.1109/55.294084
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We describe a novel 2-Dimensional Metal-Semiconductor Field Effect Transistor (2-D MESFET) in which opposing Schottky side gates formed on the sidewall of a modulation-doped AlGaAs/InGaAs heterostructure modulate the channel width and the drain current. The drain current ranged from 0 to 210 muA and the maximum measured transconductance was 212 muS (212 mS/mm) at room temperature for a 1x1 micron channel. The threshold voltage was -0.45 V and the subthreshold ideality factor was 1.30. The estimated gate capacitance was 0.8 fF/mum, or about half the equivalent capacitance of conventional HFET's. The cutoff frequency f(T) was estimated to be 21 GHz. The narrow channel effect, which limits the minimum power consumption in conventional FET's, is practically eliminated in this device.
引用
收藏
页码:245 / 247
页数:3
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