MULTIPLE SPECULAR REFLECTANCE METHOD FOR INFRARED MEASUREMENT OF METALLIC OXIDE THIN FILMS ON METAL SURFACES

被引：5
|
作者：
POBINER, H
机构：
来源：
ANALYTICAL CHEMISTRY | 1967年 / 39卷 / 01期
关键词：
D O I：
10.1021/ac60245a018
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
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页码：90 / &
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