HIGH-RESOLUTION DISPLACEMENT TRANSDUCERS - LVDTS PROVIDE HIGH-RESOLUTION DISPLACEMENT MEASUREMENTS

被引:0
|
作者
SCHAEVITZ, H
机构
来源
ELECTRONIC PRODUCTS MAGAZINE | 1975年 / 17卷 / 10期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:53 / &
相关论文
共 50 条
  • [1] Speckle pattern modulation for high-resolution displacement measurements
    Schweickhardt, Leon
    Tausendfreund, Andreas
    Stoebener, Dirk
    Fischer, Andreas
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION XII, 2021, 11782
  • [2] HIGH-RESOLUTION DISPLACEMENT MEASUREMENTS USING AUTOMATED LASER INTERFEROMETRY
    BROMLEY, JF
    JAMES, MN
    [J]. SOUTH AFRICAN JOURNAL OF SCIENCE, 1988, 84 (11) : 878 - 879
  • [3] Correction of Nonlinearity in High-Resolution Nano-Displacement Measurements
    Olyaee, Saeed
    Hamedi, Samaneh
    [J]. 2008 INTERNATIONAL SYMPOSIUM ON HIGH CAPACITY OPTICAL NETWORKS AND ENABLING TECHNOLOGIES, 2008, : 102 - 106
  • [4] High-resolution multidimensional displacement monitoring system
    Lee, NKS
    Cai, YM
    Joneja, A
    [J]. OPTICAL ENGINEERING, 1997, 36 (08) : 2287 - 2293
  • [5] High-resolution fibre-optic sensor for angular displacement measurements
    Khiat, A.
    Lamarque, F.
    Prelle, C.
    Bencheikh, N.
    Dupont, E.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2010, 21 (02)
  • [6] Are high-resolution ultrasonographic signs of disc displacement valid?
    Emshoff, R
    Jank, S
    Rudisch, A
    Bodner, G
    [J]. JOURNAL OF ORAL AND MAXILLOFACIAL SURGERY, 2002, 60 (06) : 623 - 628
  • [7] DISPLACEMENT INTERFEROMETER WITH HIGH-RESOLUTION AND LOW SENSITIVITY TO TEMPERATURE
    WAYNE, KJ
    [J]. INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL III, 1989, 1087 : 425 - 433
  • [8] Noise reduction in high-resolution speckle displacement measurements through ensemble averaging
    Schweickhardt, Leon
    Tausendfreund, Andreas
    Stoebener, Dirk
    Fischer, Andreas
    [J]. APPLIED OPTICS, 2021, 60 (07) : 1871 - 1880
  • [10] CAPACITIVE DISPLACEMENT TRANSDUCERS WITH HIGH ACCURACY AND RESOLUTION
    WOLFENDA.PC
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (08): : 817 - &