AN APPARATUS FOR PRECISE MEASUREMENT OF GLASS HOMOGENEITY BY SHELYUBSKII METHOD

被引：0

作者：

INOUE, S ^{[1
]}

YAMANE, M ^{[1
]}

SERIZAWA, T ^{[1
]}

机构：

[1] CANON INC,DIV ELECTROOPT,TOKYO,JAPAN

来源：

AMERICAN CERAMIC SOCIETY BULLETIN | 1984年 / 63卷 / 11期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1412 / 1415

页数：4

共 50 条

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