共 50 条
- [1] TEMPERATURE RISE INDUCED BY A CW LASER-BEAM REVISITED [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (12) : 5123 - 5126
- [2] TEMPERATURE DISTRIBUTIONS PRODUCED IN MULTILAYER STRUCTURES BY A SCANNING CW LASER-BEAM [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (07): : 1418 - 1427
- [4] SILICIDE FORMATION USING A SCANNING CW LASER-BEAM [J]. APPLIED PHYSICS LETTERS, 1980, 36 (07) : 566 - 569
- [5] THE DAMAGE TO POLYMER GLASSES BY SCANNING OF A CW LASER-BEAM [J]. KVANTOVAYA ELEKTRONIKA, 1989, 16 (06): : 1221 - 1225
- [6] TEMPERATURE RISE INDUCED BY A LASER-BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (09) : 3919 - 3924
- [7] MEASUREMENTS OF TEMPERATURE PROFILES IN GASES BY LASER-BEAM DEFLECTION [J]. REVUE DE PHYSIQUE APPLIQUEE, 1989, 24 (03): : 401 - 410
- [8] TARGET TEMPERATURE DISTRIBUTION GENERATED AND MAINTAINED BY A SCANNING LASER-BEAM [J]. APPLIED OPTICS, 1982, 21 (12): : 2146 - 2152
- [9] CW LASER-BEAM INDUCED MICRODEFECTS IN SILICON DETECTED BY SEM AND TEM [J]. EPM 87: ENERGY PULSE AND PARTICLE BEAM MODIFICATION OF MATERIALS, 1988, 8 : 268 - 270
- [10] HEAT-FLOW IN SUBSTRATES INDUCED BY A SCANNING LASER-BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1992, 71 (08) : 3701 - 3712