FLUX-FLOW STEPS IN OVERLAP JOSEPHSON-JUNCTIONS - IMAGING OF DIFFERENT STATES BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY (LTSEM)

被引:1
|
作者
QUENTER, D [1 ]
LACHENMANN, SG [1 ]
DODERER, T [1 ]
HUEBENER, RP [1 ]
MULLER, F [1 ]
NIEMEYER, J [1 ]
POPEL, R [1 ]
WEIMANN, T [1 ]
机构
[1] PHYS TECH BUNDESANSTALT,W-3300 BRAUNSCHWEIG,GERMANY
来源
PHYSICA B | 1994年 / 194卷
关键词
D O I
10.1016/0921-4526(94)91369-2
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Modelling a long Josephson junction with the perturbed sine-Gordon equation one possible solution represents a continous, unidirectional motion of magnetic flux quanta (fluxons). In the dc I-V curve this fluxon motion manifests itself as a current step. Using LTSEM we investigated flux-flow behavior of different types of Josephson junctions. The electron beam acts as a local perturbation influencing the ''fluxon chain'' in the Josephson junction. For different bias points on the same flux-flow step we observed different patterns inside the junction.
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页码:1739 / 1740
页数:2
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