CATHODOLUMINESCENCE IN ELECTRON-BEAM INSTRUMENTS - REVIEW

被引：0
|
作者：
BHALLA, RS [1 ]
机构：
[1] WESTINGHOUSE ELECT CORP, BLOOMFIELD, NJ 07003 USA
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1977年 / 124卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C108 / C108
页数：1
相关论文
共 50 条
  • [1] CATHODOLUMINESCENCE DEPENDENCE ON ELECTRON-BEAM DIAMETER
    ACHOUR, S
    BENLAHRACHE, MT
    HARABI, A
    TABET, N
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 24 (1-3): : 141 - 143
  • [2] ELECTRON-BEAM INSTRUMENTS AND ELECTRON LITHOGRAPHY
    VASICHEV, BN
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1982, 49 (12): : 778 - 785
  • [3] CATHODOLUMINESCENCE ASSESSMENT OF ELECTRON-BEAM RECRYSTALLIZED SILICON
    MYHAJLENKO, S
    KE, W
    HAMILTON, B
    JOURNAL OF APPLIED PHYSICS, 1983, 54 (02) : 862 - 867
  • [4] ELECTRON-BEAM EFFECT ON THE CATHODOLUMINESCENCE FROM COMPRESSED CRYSTALS
    BALLESTEROS, C
    LLOPIS, J
    PIQUERAS, J
    CRYSTAL RESEARCH AND TECHNOLOGY, 1982, 17 (07) : K70 - K74
  • [5] AIR COOLING OF ELECTRON-BEAM AND PHOTOELECTRIC INSTRUMENTS
    ABRAMENKO, AN
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1970, (04): : 1180 - +
  • [6] QUANTITATIVE PARTICLE ANALYSIS IN ELECTRON-BEAM INSTRUMENTS
    SMALL, JA
    SCANNING ELECTRON MICROSCOPY, 1981, : 447 - 461
  • [7] RESOLUTION LIMITS IN STROBOSCOPIC ELECTRON-BEAM INSTRUMENTS
    LISCHKE, B
    PLIES, E
    SCHMITT, R
    SCANNING ELECTRON MICROSCOPY, 1983, : 1177 - 1185
  • [8] Cathodoluminescence of small silicon nanoparticles under electron-beam excitation
    Abuhassan, LH
    Khanlary, MR
    Townsend, P
    Nayfeh, MH
    JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)
  • [9] Effect of Electron-Beam Irradiation on the Cathodoluminescence of a ZnO Nanorod Array
    Yakimov, E. B.
    Yakimov, E. E.
    Redkin, A. N.
    JOURNAL OF SURFACE INVESTIGATION, 2021, 15 (06): : 1208 - 1211
  • [10] Cathodoluminescence of small silicon nanoparticles under electron-beam excitation
    Abuhassan, L.H., 1600, American Institute of Physics Inc. (97):
12345