DISPLACEMENT ENERGY THRESHOLD FOR NE+ IRRADIATION OF GRAPHITE

被引：56
|
作者：
STEFFEN, HJ
MARTON, D
RABALAIS, JW
机构：
[1] Department of Chemistry, University of Houston, Houston
来源：
PHYSICAL REVIEW LETTERS | 1992年 / 68卷 / 11期
关键词：
D O I：
10.1103/PhysRevLett.68.1726
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A method for direct determination of the threshold energy (E(d)) for displacing atoms by low-energy ion irradiation to form residual point defects is described, The method is demonstrated for Ne+ irradiation of graphite. The damage induced by low Ne+ doses (< 2 x 10(15) ions/cm2) was quantified by means of a defect-sensitive feature in the Auger electron spectrum. The defect production rates at different Ne+ energies yield a displacement energy of E(d) = 35.3 +/- 1 eV. This result provides new insight into the elementary collision processes leading to point defect creation.
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收藏
页码：1726 / 1729
页数：4
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