共 8 条
- [1] X-RAY PHOTOELECTRON-SPECTROSCOPY AND SECONDARY-ION MASS-SPECTROMETRY STUDIES OF SOME SURFACE-MODIFIED HYDROCARBON FILMS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (05): : 2705 - 2710
- [3] SECONDARY-ION MASS-SPECTROMETRY TIME-OF-FLIGHT AND IN-SITU X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF POLYMER SURFACE MODIFICATIONS BY A REMOTE OXYGEN PLASMA TREATMENT JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (04): : 2491 - 2498
- [4] A STUDY OF THE DISTRIBUTION OF HYDROGEN AND STRAIN IN PROTON-BOMBARDED LIQUID-ENCAPSULATED CZOCHRALSKI-GROWN GAAS BY DOUBLE-CRYSTAL X-RAY-DIFFRACTION AND SECONDARY ION MASS-SPECTROMETRY MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1989, 2 (1-3): : 91 - 97
- [8] Lanthanum doped hafnium oxide thin films deposited on a lateral high aspect ratio structure using atomic layer deposition: A comparative study of surface composition and uniformity using x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry APPLIED SURFACE SCIENCE, 2025, 680