DETERMINATION OF IMPURITIES IN SEMICONDUCTORS BY NEAR-INFRARED RAMAN-SCATTERING

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作者：

HARRIS, TD ^{[1
]}

LAMONT, MG ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1988年 / 195卷

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O6 [化学];

学科分类号：

0703 ;

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页码：244 / ANYL

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