共 50 条
- [1] QUANTITATIVE-ANALYSIS OF STEEL SURFACE USING ION MICROANALYSIS VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1976, 31 (181): : 27 - 29
- [2] QUANTITATIVE-ANALYSIS USING SECONDARY ION EMISSION ON HISTOLOGICAL SAMPLES JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 533 - 536
- [3] MATRIX EFFECTS IN SECONDARY ION EMISSION - QUANTITATIVE-ANALYSIS OF SILICATES JOURNAL DE PHYSIQUE LETTRES, 1980, 41 (10): : L247 - L250
- [5] QUANTITATIVE-ANALYSIS USING SPUTTERED NEUTRALS IN A SECONDARY ION MICROANALYZER NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6): : 159 - 164
- [6] MATRIX EFFECTS IN SECONDARY ION EMISSION - QUANTITATIVE-ANALYSIS OF SILICATES COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1980, 290 (03): : 51 - 54
- [7] LINEAR VARIATION OF THE SECONDARY ION YIELD - QUANTITATIVE-ANALYSIS OF THE SILICATES JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1980, 5 (02): : 231 - 242
- [8] OCCURRENCE OF DIRECTIONAL EFFECTS ON QUANTITATIVE-ANALYSIS BY SECONDARY ION EMISSION COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1973, 277 (21): : 643 - 646
- [10] QUANTITATIVE-ANALYSIS OF ELECTRODEPOSIT ON STEEL BY SECONDARY ION MASS-SPECTROMETRY TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (11): : 1775 - 1781