ELECTROMAGNETIC PROPERTIES OF YBA2CU3O7-DELTA THIN-FILM GRAIN-BOUNDARY WEAK LINKS

被引：25
|
作者：
MOECKLY, BH
BUHRMAN, RA
机构：
[1] School of Applied and Engineering Physics Cornell University, Ithaca
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期
关键词：
D O I：
10.1109/77.403325
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The I-V characteristics of thin film microbridges containing 90 degrees basal-plane-faced tilt boundaries (TBs) exhibit pronounced resonant structure. This structure is attributable to the presence of ''beating modes'' previously studied in high Q DC SQUID structures having substantial shunt capacitance and large inductance. Less pronounced but clear resonant structure is also observable in in-plane c-axis TBs. We discuss a model which accounts for this behavior.
引用
收藏
页码：3414 / 3417
页数：4
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