TRACE ANALYSIS OF CERAMIC SURFACES BY LASER IONIZATION MASS-SPECTROMETRY

被引：8
|
作者：
BECKER, JS
DIETZE, HJ
机构：
[1] Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, Jülich 1
来源：
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1993年 / 346卷 / 1-3期
关键词：
D O I：
10.1007/BF00321398
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Laser ionization mass spectrometry (LIMS) is an analytical method for the simultaneous determination of concentrations of trace elements in solid samples and for the analysis of layers with thicknesses > 1 mum. This laser-induced surface analytical method is limited by the laser focus and crater depth of the laser system applied. Results of mass spectrometric trace analysis on a silicon carbide surface, ZrO2 and high-T(c) superconducting ceramics are discussed.
引用
收藏
页码：134 / 137
页数：4
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