GENETIC ALGORITHMS FOR NONDESTRUCTIVE TESTING IN CRACK IDENTIFICATION

被引：24
|
作者：
ARKADAN, AA
SAREEN, T
SUBRAMANIAM, S
机构：
[1] Dept. of Electrical and Computer Engineering, Marquette University, Milwaukee
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期
关键词：
D O I：
10.1109/20.334074
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method to identify the nature of a crack on the surface of a region using nondestructive testing (NDT) and inverse problem methodology is presented. A genetic algorithm (GA) based approach, which involves a global search to avoid local minima, is presented and applied to salve the inverse problem of identifying the position, shape and the orientation of a surface crack. A fine tuning algorithm is combined with the GA to reach the optimum solution.
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页码：4320 / 4322
页数：3
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