CHARACTERIZATION OF STRUCTURE AND LOCAL HYDROGEN-BONDING OF SILICON-NITRIDE OPTICAL COATINGS BY RAMAN-SPECTROSCOPY

被引：0
|
作者：
MARTIN, PM [1 ]
EXARHOS, GJ [1 ]
机构：
[1] PACIFIC NW LABS, DEPT MAT, RICHLAND, WA 99352 USA
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1983年 / 73卷 / 12期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1870 / 1870
页数：1
相关论文
共 50 条
  • [1] AN INVESTIGATION OF HYDROGEN-BONDING IN AMIDES USING RAMAN-SPECTROSCOPY
    TRIGGS, NE
    VALENTINI, JJ
    [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1992, 96 (17): : 6922 - 6931
  • [2] INFLUENCE OF STOICHIOMETRY AND HYDROGEN-BONDING ON THE INSULATING PROPERTIES OF PECVD SILICON-NITRIDE
    CHAUSSAT, C
    BUSTARRET, E
    BRUYERE, JC
    GROLEAU, R
    [J]. PHYSICA B & C, 1985, 129 (1-3): : 215 - 219
  • [3] STUDY OF GRAIN-BOUNDARY PHASE IN SILICON-NITRIDE MATERIALS BY RAMAN-SPECTROSCOPY
    LAOUI, T
    VANDERBIEST, O
    [J]. SILICON NITRIDE 93, 1994, 89-9 : 495 - 499
  • [4] HYDROGEN-BONDING IN LIQUID AMIDES STUDIED BY LOW-FREQUENCY RAMAN-SPECTROSCOPY
    NIELSEN, OF
    [J]. JOURNAL OF MOLECULAR STRUCTURE, 1988, 175 : 251 - 256
  • [5] HYDROGEN-BONDING AND REACTION SPECIFICITY IN LACTATE-DEHYDROGENASE STUDIED BY RAMAN-SPECTROSCOPY
    DENG, H
    ZHENG, J
    BURGNER, J
    CALLENDER, R
    [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1989, 93 (12): : 4710 - 4713
  • [6] EFFECT OF HYDROGEN-BONDING CHARACTERISTICS ON THE CORROSION OF PLASMA-DEPOSITED SILICON-NITRIDE FILMS
    ROCHELEAU, RE
    ZHANG, Z
    IWANE, A
    HIHARA, LH
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (07) : 1938 - 1943
  • [7] HYDROGEN-BONDING CONFIGURATIONS IN SILICON-NITRIDE FILMS PREPARED BY PLASMA-ENHANCED DEPOSITION
    MAEDA, M
    NAKAMURA, H
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (01) : 484 - 489
  • [8] HYDROGEN CONCENTRATION PROFILES AND CHEMICAL BONDING IN SILICON-NITRIDE
    PEERCY, PS
    STEIN, HJ
    DOYLE, BL
    PICRAUX, ST
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1979, 8 (01) : 11 - 24
  • [9] THE CHARACTERIZATION OF POROUS SILICON BY RAMAN-SPECTROSCOPY
    GOODES, SR
    JENKINS, TE
    BEALE, MIJ
    BENJAMIN, JD
    PICKERING, C
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1988, 3 (05) : 483 - 487
  • [10] Silicon-nitride waveguides for on-chip Raman spectroscopy
    Dhakal, Ashim
    Wuytens, Pieter
    Peyskens, Frederic
    Subramanian, Ananth Z.
    Le Thomas, Nicolas
    Baets, Roel
    [J]. OPTICAL SENSING AND DETECTION III, 2014, 9141
12345