EFFECT OF PREFERRED ORIENTATION ON POSITION OF X-RAY DIFFRACTION LINES

被引：0

|

作者：

KAGAN, AS

机构：

来源：

SOVIET PHYSICS TECHNICAL PHYSICS-USSR | 1966年 / 11卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：378 / &

相关论文

共 50 条

[1] PREFERRED ORIENTATION OF PYROLYTIC GRAPHITES AND ITS EFFECT ON X-RAY DIFFRACTION PATTERNS
GUENTERT, OJ
CVIKEVICH, S
[J]. CARBON, 1964, 1 (03) : 369 - 369
[2] EFFECT OF DEFORMATION ON POSITION OF X-RAY DIFFRACTION LINES FROM GOLD
MICHELL, D
SMITH, AP
[J]. PHILOSOPHICAL MAGAZINE, 1962, 7 (77): : 737 - &
[3] MINIMIZING THE EFFECTS OF PREFERRED ORIENTATION IN X-RAY POWDER DIFFRACTION PATTERNS
HILDEBRAND, FA
[J]. AMERICAN MINERALOGIST, 1953, 38 (11-1) : 1051 - 1056
[4] PREFERRED ORIENTATION DETERMINATION USING A GEIGER COUNTER X-RAY DIFFRACTION GONIOMETER
DECKER, BF
ASP, ET
HARKER, D
[J]. JOURNAL OF APPLIED PHYSICS, 1948, 19 (04) : 388 - 392
[5] Characterization of preferred orientation of silver film on copper substrates by x-ray diffraction
Li, Taotao
Dang, Ning
Liang, Wei
[J]. MATERIALS RESEARCH EXPRESS, 2019, 6 (01):
[6] COUNTER DIFFRACTOMETER - EFFECT OF SPECIMEN POSITION ON INTENSITY, POSITION, AND BREADTH OF X-RAY POWDER DIFFRACTION LINES
WILSON, AJC
[J]. SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1972, 16 (06): : 991 - &
[7] DETERMINATION OF TRUE INTENSITY AND POSITION OF X-RAY LINES IN X-RAY DIFFRACTION DIAGRAMS (EXCHANGE OF EXPERIENCE)
BAIKOV, AM
LANDA, VA
[J]. INDUSTRIAL LABORATORY, 1968, 34 (09): : 1322 - &
[8] EFFECT OF TEXTURE ON SHAPE OF X-RAY DIFFRACTION LINES
KAGAN, AS
[J]. SOVIET PHYSICS-TECHNICAL PHYSICS, 1964, 9 (03): : 433 - &
[9] Interface structure and preferred orientation of Ag/Si(111) revealed by X-ray diffraction
Akimoto, K
Lijadi, M
Ito, S
Ichimiya, A
[J]. SURFACE REVIEW AND LETTERS, 1998, 5 (3-4) : 719 - 722
[10] Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile
Li, Taotao
Zheng, Liuwei
Zhang, Wanggang
Zhu, Pengfei
[J]. NANOMATERIALS, 2021, 11 (09)

← 1 2 3 4 5 →