GROWING OF THE FLICKER NOISE, CAUSED BY DEFECT ELECTROMIGRATION IN CDTE CRYSTALS

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KUCHMA, NI
NIKONYUK, ES
TROTSYUK, NI
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ZHURNAL TEKHNICHESKOI FIZIKI | 1986年 / 56卷 / 06期
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O59 [应用物理学];
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页码:1201 / 1203
页数:3
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