DETERMINATION OF THE DENSITY OF STATES IN AMORPHOUS-SILICON FROM THERMOSTIMULATED CONDUCTIVITY MEASUREMENTS

被引:2
|
作者
LANDWEER, G
SCHREUTELKAMP, R
SIMONS, H
BEZEMER, J
VANDERWEG, WF
机构
关键词
D O I
10.1016/0022-3093(87)90168-2
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:711 / 714
页数:4
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