LINEAR AND NON-LINEAR INTENSITY DEPENDENT REFRACTIVE-INDEX OF HG1-XCDXTE

被引:45
|
作者
JENSEN, B
TORABI, A
机构
关键词
D O I
10.1063/1.331770
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:5945 / 5949
页数:5
相关论文
共 50 条
  • [1] DISPERSION OF THE REFRACTIVE-INDEX OF HG1-XCDXTE
    KUCERA, Z
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1987, 100 (02): : 659 - 665
  • [2] NON-LINEAR OPTICAL EFFECTS IN HG1-XCDXTE
    KRUSE, PW
    READY, JF
    KHAN, MA
    [J]. INFRARED PHYSICS, 1979, 19 (3-4): : 497 - 506
  • [3] COMPOSITION AND TEMPERATURE-DEPENDENCE OF THE REFRACTIVE-INDEX IN HG1-XCDXTE
    LIU, K
    CHU, JH
    TANG, DY
    [J]. JOURNAL OF APPLIED PHYSICS, 1994, 75 (08) : 4176 - 4179
  • [4] REFRACTIVE-INDEX AND EXTINCTION COEFFICIENT OF HG1-XCDXTE AT 77 AND 300 K
    JIANG, RQ
    ZHANG, SZ
    WU, FF
    HU, XR
    FANG, JX
    SHEN, J
    XU, GS
    [J]. CHINESE PHYSICS LETTERS, 1994, 11 (05) : 314 - 316
  • [5] LINEAR ABSORPTION IN HG1-XCDXTE
    NATHAN, V
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 147 (01): : K45 - K47
  • [6] NON-LINEAR REFRACTIVE-INDEX OF GLASSES AND CRYSTALS
    WEBER, MJ
    MILAM, D
    SMITH, WL
    [J]. OPTICAL ENGINEERING, 1978, 17 (05) : 463 - 469
  • [7] MEASUREMENT OF NON-LINEAR REFRACTIVE-INDEX OF POLYALKYLTHIOPHENE FILMS
    FUKAYA, T
    HEINAMAKI, A
    STUBB, H
    [J]. JOURNAL OF MOLECULAR ELECTRONICS, 1989, 5 (03): : 187 - 191
  • [8] MEASUREMENT OF COEFFICIENTS OF NON-LINEAR REFRACTIVE-INDEX IN CDS CRYSTALS BY NON-LINEAR REFRACTION METHOD
    BORSHCH, AA
    BRODIN, MS
    KRUPA, NN
    LUKOMSKY, VP
    PISARENKO, VG
    PETROPAVLOVSKY, AI
    CHERNY, VV
    [J]. ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1978, 75 (01): : 82 - 87
  • [9] Noise properties of linear defects in Hg1-xCdxTe
    Virt, IS
    Obermayr, W
    Bilyk, M
    Kuzma, M
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (08) : 831 - 833
  • [10] Refractive index dispersion of Hg1-xCdxTe by infrared spectroscopic ellipsometry
    Huang, ZM
    Chu, JH
    [J]. INFRARED PHYSICS & TECHNOLOGY, 2001, 42 (02) : 77 - 80