Guest Editorial Special Issue on Reliable Aspects of Embedded Hardware

被引：0
|
作者：
Kumar, Rakesh [1 ]
机构：
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
来源：
IEEE EMBEDDED SYSTEMS LETTERS | 2010年 / 2卷 / 04期
关键词：
D O I：
10.1109/LES.2010.2098450
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：101 / +
页数：2
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