THE EFFECT OF TRAPPED FLUX UPON THE MAGNETIC-FIELD DEPENDENCE OF THE CRITICAL-CURRENT OF JOSEPHSON-JUNCTIONS

被引:2
|
作者
TARTE, EJ
LEAN, HW
WALDRAM, JR
机构
[1] Interdisciplinary Research Centre in Superconductivity, University of Cambridge
关键词
D O I
10.1109/77.403070
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurements of the magnetic field dependence of the critical current I-c(B) of Josephson junctions, involving high temperature superconductors, often give evidence that the supercurrents are spatially non-uniform. However, flux trapping can complicate the interpretation of I-c(B) curves. A model has been developed for the behavior of SNS type junctions in a trilayer geometry containing trapped flux. We have investigated, using this model, combined with simulations, how the features of the I-c(B) curve change as the number of trapped fluxlines increases. For a uniform junction, flux-trapping distorts the I-c(B) curve and suppresses the maximum critical current by 1/root N-f where N-f is the number of fluxlines. The effect of trapped flux on current density correlation functions derived using the Wiener-Khinchine theorem from I-c(B) curves has also been investigated and is described. In addition we discuss the relevance of the model to planar geometries.
引用
收藏
页码:2388 / 2391
页数:4
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