X-RAY-RADIATION EFFECTS ON SEMICONDUCTOR-DEVICES

被引：0
|
作者：
CHAUHAN, AS [1 ]
MAHESHWARI, LK [1 ]
机构：
[1] BIRLA INST TECHNOL & SCI,DEPT ELECT & ELECTR ENGN,PILANI,RAJASTHAN,INDIA
来源：
INDIAN JOURNAL OF PURE & APPLIED PHYSICS | 1975年 / 13卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：226 / 228
页数：3
相关论文
共 50 条
  • [1] RADIATION EFFECTS ON SEMICONDUCTOR-DEVICES
    GREGORY, BL
    GWYN, CW
    [J]. PROCEEDINGS OF THE IEEE, 1974, 62 (09) : 1264 - 1273
  • [2] X-RAY RADIATION EFFECTS ON SEMICONDUCTOR DEVICES.
    Chauhan, A.S.
    Maheshwari, L.K.
    [J]. Indian Journal of Pure and Applied Physics, 1975, 13 (04): : 226 - 228
  • [3] SEMICONDUCTOR-DETECTORS FOR X-RAY-RADIATION USED IN WELL INVESTIGATIONS
    BALDIN, SA
    GUBIN, SF
    EGIAZAROV, BG
    KHOLOMOV, MD
    [J]. SOVIET ATOMIC ENERGY, 1975, 39 (06): : 1101 - 1103
  • [4] X-RAY-RADIATION OF SUBFLARES
    VALNICEC, BI
    LIKIN, OB
    MOROZOVA, EI
    PISARENKO, NF
    FARNIK, F
    [J]. GEOMAGNETIZM I AERONOMIYA, 1983, 23 (04): : 666 - 668
  • [5] X-RAY-RADIATION DAMAGE AND A RELIABILITY STUDY ON BIPOLAR-DEVICES
    BOYNE, D
    HSIA, L
    WACHNIK, R
    DECKER, R
    WASIK, C
    [J]. APPLIED PHYSICS LETTERS, 1991, 58 (23) : 2687 - 2689
  • [6] COMPARISON OF NEUTRON, PROTON AND GAMMA-RAY EFFECTS IN SEMICONDUCTOR-DEVICES
    RAYMOND, JP
    PETERSEN, EL
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) : 1622 - 1628
  • [7] MICRODEFECTS IN X-RAY-RADIATION DETECTORS
    GIMANOV, VP
    KHOLODOVA, LA
    GOGANOV, DA
    BLYAKHER, EV
    KOROLEV, VV
    SOLOVEVA, EV
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1982, 25 (04) : 1022 - 1024
  • [8] RADIATION TESTING OF SEMICONDUCTOR-DEVICES FOR SPACE ELECTRONICS
    PEASE, RL
    JOHNSTON, AH
    AZAREWICZ, JL
    [J]. PROCEEDINGS OF THE IEEE, 1988, 76 (11) : 1510 - 1526
  • [9] INTERFERENCE SPECTROSCOPY OF X-RAY-RADIATION
    INDENBOM, VL
    [J]. KRISTALLOGRAFIYA, 1976, 21 (03): : 479 - 483
  • [10] APPLICATIONS OF THE ENERGY-DISPERSIVE X-RAY-MICROANALYSIS ON SEMICONDUCTOR-DEVICES
    MATSUKAWA, T
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (01): : 76 - 76
12345