PHASE-SHIFTING IN AN OBLIQUE-INCIDENCE INTERFEROMETER

被引:11
|
作者
BOEBEL, D
PACKROSS, B
TIZIANI, HJ
机构
[1] UNIV STUTTGART,INST TECH OPT,W-7000 STUTTGART 80,GERMANY
[2] UNIV STUTTGART,INST APPL OPT,W-7000 STUTTGART 80,GERMANY
关键词
OBLIQUE INCIDENCE INTERFEROMETERS; FRINGE ANALYSIS; PHASE-STEPPING TECHNIQUE; VARIABLE FRINGE DENSITY; OPTICALLY ROUGH SURFACES;
D O I
10.1117/12.56025
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The evaluation of the interference pattern of a prism interferometer by a phase-stepping technique is described. The required phase shift is achieved by moving the surface under test perpendicular to the hypotenuse of the prism. Limits of this phase-shifting technique are discussed. A calibration method of the phase shift between the interferograms for the adjustable sensitivity of the interferometer is shown. Finally measurements of technical surfaces are presented.
引用
收藏
页码:1910 / 1914
页数:5
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