RADIATION DAMAGE EFFECTS IN SEMICONDUCTOR DETECTORS

被引：0
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作者：
DEARNALEY, G
机构：
来源：
NUCLEONICS | 1964年 / 22卷 / 07期
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D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
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页码：78 / &
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