ABSOLUTE EVALUATION METHODS IN X-RAY SPECTROMETRY

被引：2
|
作者：
PLESCH, R [1 ]
机构：
[1] SIEMENS AG,BEREICH MESS & PROZESSTECH,D-7500 KARLSRUHE,POSTFACH 211080,FED REP GER
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1975年 / 275卷 / 02期
关键词：
D O I：
10.1007/BF00454457
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：97 / 102
页数：6
相关论文
共 50 条
  • [1] RELATIVE METHODS OF EVALUATION IN X-RAY SPECTROMETRY
    PLESCH, R
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1975, 275 (04): : 269 - 274
  • [2] THE RECIPROCAL EVALUATION IN X-RAY SPECTROMETRY
    PLESCH, R
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1986, 325 (08): : 686 - 690
  • [3] X-ray spectrometry for lunar resources evaluation
    Rodriguez, R
    PROCEEDINGS OF THE FOURTH INTERNATIONAL CONFERENCE ON EXPLORATION AND UTILISATION OF THE MOON, 2000, 462 : 251 - 254
  • [4] AUXILIARY METHODS OF MATRIX CORRECTION IN X-RAY SPECTROMETRY
    PLESCH, R
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1980, 302 (05): : 393 - 397
  • [5] X-ray spectrometry
    Tsuji, Kouichi
    Nakano, Kazuhiko
    Hayashi, Hisashi
    Hayashi, Kouichi
    Ro, Chul-Un
    ANALYTICAL CHEMISTRY, 2008, 80 (12) : 4421 - 4454
  • [6] X-RAY SPECTROMETRY
    MACDONALD, GL
    ANALYTICAL CHEMISTRY, 1980, 52 (05) : R100 - R106
  • [7] X-ray Spectrometry
    Tsuji, Kouichi
    Nakano, Kazuhiko
    Takahashi, Yoshio
    Hayashi, Kouichi
    Ro, Chul-Un
    ANALYTICAL CHEMISTRY, 2012, 84 (02) : 636 - 668
  • [8] X-RAY SPECTROMETRY
    TOROK, SB
    VANGRIEKEN, RE
    ANALYTICAL CHEMISTRY, 1994, 66 (12) : R186 - R206
  • [9] X-RAY SPECTROMETRY
    LEYDEN, DE
    TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1983, 2 (03) : R10 - R11
  • [10] X-RAY SPECTROMETRY
    BIRKS, LS
    GILFRICH, JV
    ANALYTICAL CHEMISTRY, 1976, 48 (05) : R273 - R281
12345