A SIMPLE METHOD TO DETECT KILLER YEASTS IN INDUSTRIAL-SYSTEMS

被引：6

作者：

PASQUAL, MS ^{[1
]}

CARRAU, JL ^{[1
]}

SERAFINI, LA ^{[1
]}

DILLON, AJP ^{[1
]}

机构：

[1] UNIV CAXIAS SUL RUA FRANCISCO GETULIO VARGAS,INST BIOTECNOL,BR-1130 CAXIAS SUL,RS,BRAZIL

来源：

JOURNAL OF FERMENTATION AND BIOENGINEERING | 1990年 / 70卷 / 03期

关键词：

D O I：

10.1016/0922-338X(90)90181-U

中图分类号：

Q81 [生物工程学（生物技术）]; Q93 [微生物学];

学科分类号：

071005 ; 0836 ; 090102 ; 100705 ;

摘要：

In this paper the authors propose a new technique to detect killer yeasts. This technique is characterized by its quick, simple execution and by being more economical than the already described tranditional technique. It consists basically of plating the sample to be analyzed with a proper sensitive yeast cells on WLN differential medium (Difeo). The analyses of the results may be carried out immediately after the incubation period (approximately 48 h at 25°C). When killer strains are present typical "batik" colonies are observed. © 1989.

引用

页码：180 / 181

页数：2

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