BEAM DIVERGENCE AND ION DENSITY-MEASUREMENTS FOR AN INDUCTION COUPLED ION-BEAM SOURCE

被引:2
|
作者
PAI, JR
VENKATRAMANI, N
机构
[1] Thermal Plasma Section, Laser and Plasma Technology Division, B.A.R.C. Trombay
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 11期
关键词
D O I
10.1063/1.1143433
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this article the ion beam of H+ and Ar+ produced from the low-pressure radio frequency ionized plasma is analyzed for beam divergence. The divergence measurement method adopted for a low-energy beam is described. The divergence values for H+ and Ar+, respectively, are 0.4-degrees and 1.1-degrees for a beam energy of 2.5 kV. It is found that the beam divergence varies with the extraction voltage. In case of H+ beam, the divergence value varies from 2.8-degrees to 0.4-degrees for the extraction voltage of 500 V to 2.5 kV, and in the case of Ar+ beam this value is from 1.3-degrees to 1.1-degrees for the extraction voltage of 1000 V to 2.5 kV. The extraction electrode is concave outward as shown in the figure of the extraction system. The rf plasma is diagnosed using the double-probe technique for ion density estimation. The axial variation of the electron density and the electron temperature are obtained for both hydrogen as well as argon plasmas. The electron density is maximum, near the end of the coil.
引用
收藏
页码:5234 / 5236
页数:3
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