共 50 条
- [1] INDUCTION-COUPLED ION-BEAM SOURCE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (01): : 490 - 492
- [2] ION DENSITY-MEASUREMENTS IN TFR BY NEUTRAL BEAM ATTENUATION [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (09): : 1087 - 1087
- [3] Beam emittance measurements of transformer coupled plasma ion source for focused ion beam [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05): : 1681 - 1683
- [4] The influence of beam divergence on ion-beam induced surface patterns [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (8-9): : 1407 - 1411
- [5] ION-BEAM DIVERGENCE IN 2 STAGE ACCELERATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (07) : 1029 - 1033
- [6] CALCULATIONS INVOLVING ION-BEAM SOURCE [J]. JOURNAL OF COMPUTATIONAL PHYSICS, 1978, 28 (03) : 408 - 415
- [7] ION-BEAM DEPOSITION AND INSITU ION-BEAM ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 63 (1-2): : 109 - 119
- [8] BEAM-SIZE MEASUREMENTS IN FOCUSED ION-BEAM SYSTEMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (02): : 899 - 901
- [9] EFFECT OF PREACCELERATION VOLTAGE UPON ION-BEAM DIVERGENCE [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (06) : 3091 - 3101
- [10] REACTIVE ION-BEAM ETCHING USING A BROAD BEAM ECR ION-SOURCE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (01): : L4 - L6